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		Figure 2.20 Yield vs. wafer defects for Poisson distributed defects. The improved estimate is based on the work of Murphy [210]. See also Walker [299].



		The total number of die realized by the 21-cm wafer is



		For 2.3 cm² die,



		N = 130 (d = 21, A = 2.3),



		and for 1.0 cm² die,



		N = 314 (d = 21, A = 1).



		The yield is (rD = 1 defect/cm²).



		For 2.3 cm²:



		Y = 0.1 (A = 2.3, rD = 1).



		For 1.0 cm²:



		Y = 0.37 (A = 1, rD = 1).



		So, since

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